Identification and Structural Characterization of Twisted Atomically Thin Bilayer Materials by Deep Learning Permalink
Published in Nano Letters, Volume 24, Issue 9, Pages 2789-2797, 2024
This paper describes the use of optical microscopy and deep learning to identify and characterize twisted bilayer materials.
Recommended citation: Yong Xie, Haitao Yang, Ruiqi Hu, et al. (2024). "Identification and Structural Characterization of Twisted Atomically Thin Bilayer Materials by Deep Learning." Nano Letters, 24(9), 2789-2797.
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