Yong Xie

Yong Xie

Visiting professor @ ICMM

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A list of all the posts and pages found on the site. For you robots out there is an XML version available for digesting as well.

Pages

Posts

Future Blog Post

less than 1 minute read

Published:

This post will show up by default. To disable scheduling of future posts, edit config.yml and set future: false.

Blog Post number 4

less than 1 minute read

Published:

This is a sample blog post. Lorem ipsum I can’t remember the rest of lorem ipsum and don’t have an internet connection right now. Testing testing testing this blog post. Blog posts are cool.

Blog Post number 3

less than 1 minute read

Published:

This is a sample blog post. Lorem ipsum I can’t remember the rest of lorem ipsum and don’t have an internet connection right now. Testing testing testing this blog post. Blog posts are cool.

Blog Post number 2

less than 1 minute read

Published:

This is a sample blog post. Lorem ipsum I can’t remember the rest of lorem ipsum and don’t have an internet connection right now. Testing testing testing this blog post. Blog posts are cool.

Blog Post number 1

less than 1 minute read

Published:

This is a sample blog post. Lorem ipsum I can’t remember the rest of lorem ipsum and don’t have an internet connection right now. Testing testing testing this blog post. Blog posts are cool.

portfolio

publications

Straining and Tuning Atomic Layer Nanoelectromechanical Resonators via Comb-Drive MEMS Actuators Permalink

Published in Advanced Materials Technologies, Volume 6, Issue 2, Article 2000794, 2021

This paper demonstrates a heterogeneous integration approach for continuous and broad frequency tuning in 2D NEMS resonators using voltage-controlled SOI comb-drive MEMS actuators.

Recommended citation: Yong Xie, Jaesung Lee, Yanan Wang, Philip X-L Feng. (2021). "Straining and Tuning Atomic Layer Nanoelectromechanical Resonators via Comb-Drive MEMS Actuators." Advanced Materials Technologies, 6(2), 2000794.
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Straining of Atomically Thin WSe2 Crystals: Suppressing Slippage by Thermal Annealing Permalink

Published in Journal of Applied Physics, Volume 132, Issue 8, 2022

This paper presents a facile three-point approach combined with a dry transfer method to apply uniaxial strain to two-dimensional materials, effectively suppressing slippage of WSe2 on substrate through thermal annealing.

Recommended citation: Wenshuai Hu, Yabin Wang, Kexin He, Xiaolong He, Yan Bai, Chenyang Liu, Nan Zhou, Haolin Wang, Peixian Li, Xiaohua Ma, Yong Xie. (2022). "Straining of Atomically Thin WSe2 Crystals: Suppressing Slippage by Thermal Annealing." Journal of Applied Physics, 132(8).
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Laser Trimming for Lithography-Free Fabrications of MoS2 Devices Permalink

Published in Nano Research, Volume 16, Issue 4,pages 5042–5046, 2022

This study presents a facile laser trimming method to insulate single-layer MoS2 regions from thicker multilayer areas. Electrical characterization and scanning photocurrent microscopy reveal that laser trimming effectively isolates single-layer MoS2, offering a lithography-free alternative to patterning processes.

Recommended citation: Yong Xie, Onur Çakıroğlu, Wenshuai Hu, Kexin He, Sergio Puebla, Thomas Pucher, Qinghua Zhao, Xiaohua Ma, Carmen Munuera, Andres Castellanos-Gomez. (2023). "Laser Trimming for Lithography-Free Fabrications of MoS2 Devices." Nano Research, 16(4), 5042-5046.
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Van der Waals Materials for Paper Electronics Permalink

Published in Trends in Chemistry, Volume 5, Issue 12, Pages 920-934, 2023

This review covers the state-of-the-art research progress in the development of van der Waals materials and their applications in paper-based electronics and optoelectronics.

Recommended citation: Wenliang Zhang, Kexin He, Andres Castellanos-Gomez, Yong Xie. (2023). "Van der Waals Materials for Paper Electronics." Trends in Chemistry, Elsevier.
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Identification and Structural Characterization of Twisted Atomically Thin Bilayer Materials by Deep Learning Permalink

Published in Nano Letters, Volume 24, Issue 9, Pages 2789-2797, 2024

This paper describes the use of optical microscopy and deep learning to identify and characterize twisted bilayer materials.

Recommended citation: Yong Xie, Haitao Yang, Ruiqi Hu, et al. (2024). "Identification and Structural Characterization of Twisted Atomically Thin Bilayer Materials by Deep Learning." Nano Letters, 24(9), 2789-2797.
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teaching